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Uncertainty of S-Parameter Measurements on PCBs due to Imperfections in the TRL Line Standard: Hyunji Koo, Martin Salter, No-Weon Kang, Nick Ridler, Young-Pyo Hong; J. Electromagn. Eng. Sci. 2021;21(5):369-378. Published online November 30, 2021; DOI: https://doi.org/10.26866/jees.2021.5.r.45
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Erratum to “Characterization of a 1 mm (DC to 110 GHz) Calibration Kit for VNA”: Chihyun Cho, Jin-Seob Kang, Joo-Gwang Lee, Hyunji Koo; J. Electromagn. Eng. Sci. 2021;21(2):165-165. Published online April 30, 2021; DOI: https://doi.org/10.26866/jees.2021.21.2.e Corrects: J. Electromagn. Eng. Sci 2019;19(4):272; Full text PubReader ePub PDF

Measurement of Analog Modulation Index with a Calibrated Radio Frequency Attenuator: Chihyun Cho, Hyunji Koo, Jae-Yong Kwon, Joo-Gwang Lee, Tae-Weon Kang; J. Electromagn. Eng. Sci. 2021;21(2):87-94. Published online April 30, 2021; DOI: https://doi.org/10.26866/jees.2021.21.2.87
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Characterization of a 1 mm (DC to 110 GHz) Calibration Kit for VNA: Chihyun Cho, Jin-Seob Kang, Joo-Gwang Lee, Hyunji Koo; J. Electromagn. Eng. Sci. 2019;19(4):272-278. Published online October 31, 2019; DOI: https://doi.org/10.26866/jees.2019.19.4.272
Correction in: J. Electromagn. Eng. Sci 2021;21(2):165
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