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Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses
Zhikang Yang, Lin Wen, Yudong Li, Dong Zhou, Xin Wang, Rui Ding, Meiqing Zhong, Cui Meng, Wenxiao Fang, Qi Guo
J. Electromagn. Eng. Sci.
2024;24(2):151-160. Published online March 31, 2024
DOI:
https://doi.org/10.26866/jees.2024.2.r.215
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ABOUT
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