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Free-Space Unknown Thru Measurement Using Planar Offset Short for Material Characterization
Jin-Seob Kang
J. Electromagn. Eng. Sci. 2022;22(5):555-562. Published online 2022 Sep 30 DOI: https://doi.org/10.26866/jees.2022.5.r.122
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Citations to this article as recorded by
 Characterization of Resistance and Inductance of PIN Diode at mmWave Frequency Using 7-Layer Deep Neural Network
Lihour Nov, Thorn Chrek, Jae-Young Chung
IEEE Access.2023; 11: 126782. CrossRef Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement
Jin-Seob Kang
Journal of Electromagnetic Engineering and Science.2022; 22(6): 656. CrossRef
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